Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope.
نویسندگان
چکیده
A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.
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ورودعنوان ژورنال:
- Nanotechnology
دوره 20 14 شماره
صفحات -
تاریخ انتشار 2009